研究成果目錄：論文及著述

Journal Papers 期刊論文 (Recent Years)

1. Argon Chen and Y.K. Chen, “Design of EWMA and CUSUM Control Charts Subject to Random Shifts and Quality Impacts,” IIE Transactions (SCI), 1127-1141, 39, 12, 2007.

2. Argon Chen and G.S. Wu, “Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration,” International Journal of Production Research (SCI), 45, 15, 2007.

3. Argon Chen, Chia-Hau Hsu and Jakey Lan, “Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning,” International Journal of Production Research (SCI), pp. 2269-2294, 45, 10, 2007.

4. David Chiang, Ruey-Shan Guo, Argon Chen (Corresponding Author), and Meng-Tse Cheng, “Optimal Supply Chain Configurations in Semiconductor Manufacturing,” International Journal of Production Research (SCI), pp.631-651, 45, 3, 2007.

5. Argon Chen, K. Yang, Z. Hsia, “Weighted least-square Estimation of Demand Product Mix and Its application to Semiconductor Demand,” International Journal of Production Research (SCI), pp. 4445-4462, 46, 16, 2008.

6. Argon Chen, “Taiwan’s paradigm shift – Industrial engineers are shaping a nation,” Industrial Engineer (SCI), pp. 31-34, 40, 10, 2008

7. Argon Chen and Jakey Blue, “Recipe-independent Indicator for Tool Health Diagnosis and Predictive Maintenance,” IEEE Transactions on Semiconductor Manufacturing (SCI), 522-535,22, 4, November, 2009.

8. Argon Chen and Amos Hong, “Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysis”, accepted by IEEE Transactions on Semiconductor Manufacturing (SCI), pp 358-369, 23, 3, 2010.

9. Argon Chen and Jakey Blue, “Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demands,” International Journal of Production Economics (SCI), 586-602, 128, 2, 2010.

10. Jakey Blue and Argon Chen (corresponding author), “Spatial Variance Spectrum Analysis and Its Applications to Unsupervised Detection of Systematic Wafer Spatial Variations”, IEEE Transactions on Automation Science and Engineering (SCI), 56-66, 8, 1, 2011..

11. K-Y Chen, C-N Chen, M-H Wu, M-C Ho, H-C Tai, W-C Huang, Y-C Chung, Argon Chen (corresponding author), K-J Chang, “Detection of Calcifications in Thyroid Nodules by a Quantitative Method,” Ultrasound in Medicine and Biology (SCI), pp. 870-878, 37, 6, 2011.

12. Hung Hung and Argon Chen, “Test of covariance changes without a large sample and its application to fault detection and classification,” Journal of Process Control, 22, 1113-1121, 2012.

13. Amos Hong and Argon Chen (corresponding author), “Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis,” Journal of Process Control, 22, 1307-1317, 2012.

14. Mark Brantley, Loo H. Lee, Chun-Hung Chen, and Argon, “Efficient Simulation Budget Allocation with Regression,” in press, on-line version, IIE Transactions (SCI), 2012.

Book Chapters專書章節 (Recent Years)

1. Chapter 17: Age-based Double EWMA Run to Run Controller, Argon Chen and Ruey-Shan Guo, Run to Run Control in Semiconductor Manufacturing edited by Moyne, J., Del Castillo, E., and Hurwitz, A.M..

2. Chapter 19: An Enhanced EWMA Controller for Processes Subject to Random Disturbances, Ruey-Shan Guo, Argon Chen and Jin-Jung Chen, to appear as a Chapter in Run to Run Control in Semiconductor Manufacturing (tentative) edited by Moyne, J., Del Castillo, E., and Hurwitz, A.M..